[1] S. Shiri, M. Pourgol-Mohammad, M. Yazdani. Effect of strength dispersion on fatigue life prediction of composites under two-stage loading. Journal of Material and Design, 2015. Volume 65, pp 1189–1195.
[2] M. Yazdanipour, M. Pourgol-Mohammad, N. Choupani, M. Yazdani. Fatigue Life Prediction Based on Probabilistic Fracture Mechanics; Case Study of Automotive Parts. ASME-ASCE Journal of Risk and Uncertainty in Engineering Systems: Part B: Mechanical Systems. 2015, 2(1):011002-011002-6.
[3] S. Shiri, M. Pourgol-Mohammad, M. Yazdani. Prediction of Remaining Fatigue Cycles in Composite Materials under Uncertainty. ASME-ASCE Journal of Risk and Uncertainty in Engineering Systems: Part B: Mechanical Systems. 2015,2(1):011001-011001-6.
[4] S. Shiri, M. Pourgol-Mohammad, M. Yazdani. A Fatigue Damage Accumulation Model Based on Stiffness Degradation of Composite Materials. Journal of Material and Design, 88(2015)1290-1295.
[5] M. Yazdanipour, M. Pourgol-Mohammad. Stochastic Fatigue Crack Growth Analysis of Metallic Structures under Multiple Thermal -Mechanical Stress Levels. Journal of Material and Design. 2016 95,599–611.
[6] H. Salimi, S. Kiad, M. Pourgol-Mohamad. Stochastic Fatigue Crack Growth Analysis for Space System Reliability. ASME-ASCE Journal of Risk and Uncertainty in Engineering Systems: Part B: Mechanical Systems,2017,4(2):021004-021004-7.
[7] L. Naseh, M. Pourgol-Mohammad. Assessment of the Pitting Corrosion Degradation Lifetime; Case Study of Boiler Tubes, ASME-ASCE Journal of Risk and Uncertainty in Engineering Systems: Part B: Mechanical Systems. 2017, vol.3/ 041002-3.
[8] Gabriel M. Rebeiz, RF MEMS - Theory, Design, and Technology, John Wiley & Sons, Inc, 2003.
[9] Carmignani, G. An integrated structural framework to cost-based FMECA: The priority-cost FMECA. Reliability Engineering and System Safety 94 (4), (2009) 861-871.
[10]Selim, H., Yunusoglu, M. G. &YılmazBalaman, Ş. A Dynamic Maintenance Planning Framework Based on Fuzzy TOPSIS and FMEA: Application in an International Food Company. Quality and Reliability Engineering International (In press) (2015)
[11] J. Maciel, “Recent Reliability Results in RF MEMS”, Proceedings of the 2005 IEEE MTT-S Int. Microwave Symposium, Workshop Notes, WFE Recent Applications in RF MEMS, Long Beach, CA, June 12-17, 2005
[12] C. Goldsmith, J. Ehmke, A. Malczewski, B. Pillans, S. Eshelman, Z. Yao, J. Brank, M. Eberly, Lifetime characterization of capacitive RF MEMS switches, in: Microwave Symposium Digest, 2001 IEEE MTT-S International, IEEE, 2001, pp. 227-230.
[13] W.M. Van Spengen, R. Puers, R. Mertens, I. De Wolf, A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches, Journal of Micromechanics and Micro-engineering, 14 (2004), pp. 514-521.
[14] S. Melle, D. De Conto, D. Dubuc, K. Grenier, O. Vendier, J.-L. Muraro, J.-L. Cazaux, R. Plana, Reliability modeling of capacitive RF MEMS, Microwave Theory and Techniques, IEEE Transactions on, 53 (2005), pp. 3482-3488.
[15] S. Melle, D. De Conto, L. Mazenq, D. Dubuc, K. Grenier, L. Bary, R. Plana, O. Vendier, J. Muraro, J. Cazaux, Modeling of the dielectric charging kinetic for capacitive RF-MEMS, in: Microwave Symposium Digest, 2005 IEEE MTT-S International, IEEE, 2005, pp. 4 pp.
[16] R. Herfst, P. Steeneken, J. Schmitz, Time and voltage dependence of dielectric charging in RF MEMS capacitive switches, in: Reliability physics symposium, 2007. proceedings. 45th annual. IEEE international, IEEE, 2007, pp. 417-421.
[17] D. Mardivirin, A. Pothier, A. Crunteanu, B. Vialle, P. Blondy, Charging in dielectricless capacitive RF-MEMS switches, Microwave Theory and Techniques, IEEE Transactions on, 57 (2009), pp. 231-236.
[18] X. Yanet al., “Anelastic stress relaxation in gold films and its impact on restoring forces in MEMS devices,” J. Microelectromech. Syst., vol. 18, no. 3, pp. 570–576, 2009.
[19] C. Palego et al., “Robustness of RF MEMS capacitive switches with molybdenum membranes,” IEEE Trans. Microw. Theory Techn., vol. 57, no. 12, pp. 3262–3269, 2009.
[20] C. Goldsmith et al., “Lifetime characterization of capacitive RF MEMS switches,” in IEEE MTT-S Int. Microw. Symp. Dig., Phoenix, AZ, USA, May 2001, pp. 227–230.
[21]Yaqiu Li, Yufeng Sun, Weiwei Hu, Zili Wang, “A novel correlative model of failure mechanisms for evaluating MEMS devices reliability” Journal of Microelectronics Reliability Volume 64, September 2016, Pages 669-675.
[22]NegarTavassolian, MatroniKoutsoureli, George Papaioannou, and John Papapolymerou “Optimization of Dielectric Material Stoichiometry for High-Reliability Capacitive MEMS Switches” IEEE Microwave and Wireless Components Letters, VOL. 26, NO. 3, March 2016.
[23] N. Torres Matabosch, F. Coccetti, M. Kaynak, B. Espana, B. Tillack, J.L. Cazaux, “Failure analysis and detection methodology for capacitive RF-MEMS switches based on BEOL BiCMOS process” Journal of Microelectronics Reliability, Volume 53, Issues 9–11, September–November 2013, Pages 1659-1662.
[24] M. Lamhamdi, P. Pons, U. Zaghloul, L. Boudou, F. Coccetti, J. Guastavino, Y. Segui, G.Papaioannou, R. Plana, “Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation” Journal of Microelectronics Reliability, Volume 48, Issues 8–9, August–September 2008, Pages 1248-1252.
[25]Pourgol Mohammad M, MobasherMoghaddam M, Soleimani M. Hybrid Probabilistic Physics of Failure Evaluation of Reliability in MEMS Devices. ASME. ASME International Mechanical Engineering Congress and Exposition, Volume 14: Emerging Technologies; Materials: Genetics to Structures; Safety Engineering and Risk Analysis ():V014T14A002. doi:10.1115/IMECE2017-70984.
[26]Jamshidi, A., Rahimi, S. A., Ait-Kadi, D. & Ruiz, A. A comprehensive fuzzy risk-based maintenance framework for prioritization of medical devices. Applied Soft Computing 32 (2015) 322-334
[27] P. K. Kroese, T. Taimre, and Z. I. Botev, Handbook of Monte Carlo Methods, John Wiley & Sons, Hoboken, NJ,USA, 2011.
[28] M. Modarres, Risk Analysis in Engineering: Techniques, Tools, and Trends, CRC, New York, NY, USA, 2006.
[29] D. Kelly, C. Smith, Bayesian inference for probabilistic risk assessment: a practitioner''s guidebook, Springer Science & Business Media, 2011.
[30] G.M. Rebeiz, RF MEMS: theory, design, and technology, John Wiley & Sons, 2004.
[31] A. Jain, S. Palit, M.A. Alam, A physics-based predictive modeling framework for dielectric charging and creep in RF MEMS capacitive switches and varactors, Microelectromechanical Systems, Journal of, 21 (2012), pp. 420-430.
[32] S. Palit, A. Jain, M.A. Alam, Universal scaling and intrinsic classification of electro-mechanical actuators, Journal of Applied Physics, 113 (2013), pp. 1-8.
[33] H.S. Newman, RF MEMS switches and applications, in: Reliability Physics Symposium Proceedings, 2002. 40th Annual, IEEE, 2002, pp. 111-115.
[34] I. De Wolf, W. Van Spengen, Techniques to study the reliability of metal RF MEMS capacitive switches, Microelectronics reliability, 42 (2002), pp. 1789-1794.
[35] S. Melle, F. Flourens, D. Dubuc, K. Grenier, P. Pons, F. Pressecq, J. Kuchenbecker, J. Muraro, L. Bary, R. Plana, Reliability overview of RF MEMS devices and circuits, in: Microwave Conference, 2003. 33rd European, IEEE, 2003, pp. 37-40.
[36] G.M. Rebeiz, J.B. Muldavin, RF MEMS switches and switch circuits, Microwave Magazine, IEEE, 2 (2001), pp. 59-71.
[37] S. Palit, M.A. Alam, Theory of charging and charge transport in “intermediate” thickness dielectrics and its implications for characterization and reliability, Journal of Applied Physics, 111 (2012), pp. 1-10.
[38] M.I. Younis, E.M. Abdel-Rahman, A. Nayfeh, “A reduced-order model for electrically actuated microbeam-based MEMS”, Journal of Microelectromechanical Systems, 12 (2003), pp. 672-68.
[39]Mathwork, “Matlab Simulation Software”,